Reflection of X-rays or neutrons provides a powerful means to study the structure and composition of thin films and interfacial layers. These web pages provide information about the use of neutron (and X-ray) reflectivity. Follow the links below for more information.
| Neutron Reflectometers Instruments and facilities for reflection experiments |
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| Catalogue of Analysis Software Links to packages and web resources |
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| Adrian Rennie's Reflection Software Descriptions, manuals and downloads of analysis programs |
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| Bibliography on Neutron Reflection Links to papers about the technique - theory and experiments |
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| X-ray reflectivity analysis Software and analysis for X-reflectometry data |
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| Conference Calendar | Glossaries and Definitions | News & Contact |
